Table of Contents
1. Core Reliability Standards Framework
2. Three Major Categories of Reliability Testing
3. From Test Data to Reliability Certification
4. Selecting a High-Reliability IPM
5. About SHYSEMI
Keywords:
IPM, Reliability Test Standards, Inverter, New Energy Vehicle, Industrial Drive, MIL-STD, JEDEC, JEITA, Environmental Testing, Life Testing, Mechanical Testing, FIT, Failure Analysis, CP Test Data
Introduction
In core applications such as inverters, new energy vehicles, and industrial drives, Intelligent Power Modules (IPMs) are essential for achieving high efficiency and system integration.
However, as power density increases and environmental stress intensifies, a critical question arises:
How can we verify and ensure the long-term reliability of an IPM?
A mere claim of "high reliability" on a datasheet is insufficient. True reliability is demonstrated through rigorous, standardized, and repeatable qualification testing-a process that defines product credibility and long-term customer trust.
This article explores the international testing standards, verification methods, and engineering best practices that form the foundation of IPM reliability, followed by practical insights on selecting a high-reliability IPM.
1. Core Reliability Standards Framework
There is no single global standard governing IPM reliability. Instead, verification is achieved through a comprehensive framework that integrates multiple international and industry standards.
JEDEC (Solid State Technology Association):
The global baseline for semiconductor reliability testing, defining common test procedures across the industry.
AEC(Automotive Electronics Council):
The benchmark for automotive-grade components. IPMs intended for EVs or vehicle inverters must pass AEC-Q101 qualification, covering stress tests for discrete semiconductor devices.
MIL-STD(Military Standard):
Originating from aerospace and defense industries, this standard remains one of the strictest references for reliability assurance.
JEITA (Japan Electronics and Information Technology Industries Association):
Widely adopted by Japanese manufacturers, closely aligned with JEDEC but including regional adaptations.
Manufacturer-Specific Internal Standards:
Leading suppliers such as Infineon and Mitsubishi develop internal qualification criteria that exceed formal standards-serving as a key differentiator in product quality.
Understanding these frameworks is the first step toward interpreting any IPM reliability report.
2. Three Major Categories of Reliability Testing
IPM reliability verification encompasses three fundamental test categories-environmental, life, and mechanical/chemical-each simulating different stress conditions to expose potential failure mechanisms.
(1) Environmental Testing: Simulating Harsh Conditions
(2) Life Testing: Long-Term Electrical and Thermal Stress
(3) Mechanical and Chemical Testing: Physical Robustness
3. From Test Data to Reliability Certification
Reliability qualification is not merely about passing tests-it’s about data-driven validation.
(1) Sampling and Pre-Test Verification:
Selected samples undergo initial electrical testing to confirm nominal performance.
(2) Accelerated Stress Testing:
Environmental and life tests (e.g., HTRB, HTGB, PCT) are applied under controlled conditions.
(3) Interim and Post-Test Measurements:
Key parameters are measured for drift or failure.
(4) Failure Analysis (FA) and Statistical Modeling:
Any failed unit is analyzed to identify the root cause.
Power cycling data is typically fitted with a Weibull distribution, allowing engineers to calculate the FIT (Failures in Time) rate-where 1 FIT = 1 failure per 10⁹ device hours.
(5) Certification and Reporting:
Manufacturers summarize the data into formal reliability reports, which form part of the IPM’s qualification documentation.
4. Selecting a High-Reliability IPM
Armed with knowledge of testing principles, engineers can make informed component choices.
Key selection criteria include:
(1) Standard Compliance:
Verify whether the product meets automotive or industrial-grade standards such as AEC-Q101 or relevant JEDEC tests.
(2) Lifetime Data Transparency:
Review the ΔTj – Cycle Count curve in datasheets. A higher cycle count at the same temperature swing indicates longer expected life.
(3) FIT Value Verification:
Lower FIT values after HTRB/HTGB testing demonstrate superior intrinsic reliability.
(4) Manufacturer Reputation:
Choose suppliers with a proven record of process control and published reliability data.
5. About SHYSEMI
In today’s pursuit of higher performance, greater miniaturization, and superior energy efficiency, IPM reliability has evolved from an afterthought into a defining metric of product success.
Understanding the stringent testing standards and qualification frameworks behind modern IPMs enables engineers to design systems that perform safely and reliably for years-or even decades.
At SHYSEMI, we specialize in medium- and high-power semiconductor solutions, offering full-chain development from IGBT chip design to module production.
By leveraging wafer-level CP testing and advanced process control, we have achieved a breakthrough-increasing product voltage capability from 1200 V to 1700 V without enlarging the die size.
Our products consistently rank among the industry’s best, trusted by global partners including Xiaomi, Volkswagen, Changhong, and TCL.
For more information on our IPM reliability and testing capabilities, please [contact us] to discuss how SHYSEMI can support your next-generation power systems.