• Proven Reliability of Our IPM Devices

  • Quality Excellence in Power Semiconductors | SHYSEMI

    At SHYSEMI, quality is our core. We implement rigorous quality control across our entire supply chain—from raw material sourcing to advanced manufacturing. Equipped with state-of-the-art packaging lines and testing facilities for electronic components and power devices, we are ISO9001 and IATF 16949 certified. Our premium product range is fully AEC-Q qualified, ensuring superior consistency and reliability for automotive and industrial applications.

  • Comprehensive Reliability Testing & Qualification Data

    Our products are validated through industry-standard testing, including HTGB, HTRB, power cycling, and thermal performance evaluation, ensuring long-term stability and performance in demanding applications.

    Test Item: Highly Accelerated Stress Test (HAST)

    Experimental Conditions: Ta = 130 ± 2 °C, 85 % ± 5% RH，230 kPa (Relative Pressure), Vce=42V, 96h

    Testing Manufacturer: HIRAYAMA株式会社 (Japan)

    Executive Standard: JESD22-A110

    Test Item: Unbiased Highly Accelerated Stress Test (UHAST)

    Experimental Conditions: Ta = 130 ± 2 ℃, 85 % ± 5 % RH, 230 kPa (Relative Pressure), 96h

    Testing Manufacturer: HIRAYAMA株式会社 (Japan)

    Executive Standard: JESD22-A118

    Test Item: Thermal Shock Test (TST)

    Experimental Conditions: -40 ℃ (15min) ~ +125 ℃ (15min), 500 cycles

    Testing Manufacturer: Vötschtechnik (Germany)

    Executive Standard: JESD22-A106

    Test Item: Power Cycling Test (PC)

    Experimental Conditions: -40 ℃ (15min) ~ +125 ℃ (15min), 500 cycles

    Testing Manufacturer: Vötschtechnik (Germany)

    Executive Standard: JESD22-A106

    Test Item: Temperature Cycling Test (TCT)

    Experimental Conditions: 25 °C ~ −40 °C (cooling, 4.5 min) ~ −40 °C (dwell, 15 min) ~ 25 °C (heating, 4.5 min) ~ 25 °C (dwell, 5 min) ~ 125 °C (heating, 7 min) ~ 125 °C (dwell, 15 min) ~ 25 °C (cooling, 7 min) ~ 25 °C (dwell, 5 min) 500 cycles

    Testing Manufacturer: Vötschtechnik (Germany)

    Executive Standard: JESD22-A104

    Test Item: High Temperature Reverse Bias Test (HTRB)

    Experimental Conditions: Ta=125; VCE=480V; 1000Hrs

    Testing Manufacturer: Hangzhou Zhong'an Electronics Co., Ltd.

    Executive Standard: JESD22-A108

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