• Proven Reliability of Our IPM Devices

  • Quality Excellence in Power Semiconductors

    At SHYSEMI, reliability testing is our commitment to our customers.

    At SHYSEMI, quality is our core. We implement rigorous quality control across our entire supply chain—from raw material sourcing to advanced manufacturing. Equipped with state-of-the-art packaging lines and testing facilities for electronic components and power devices, we are ISO9001 and IATF 16949 certified. Our premium product range is fully AEC-Q qualified, ensuring superior consistency and reliability for automotive and industrial applications.

  • Comprehensive Reliability Testing & Qualification Data

    Our products are validated through industry-standard testing, including HTGB, HTRB, power cycling, and thermal performance evaluation, ensuring long-term stability and performance in demanding applications.

    Test Item: Thermal Shock Test (TST)

    Experimental Conditions: -40 °C (15min) ~ +125 °C (15min), 500 cycles

    Testing Manufacturer: Vötschtechnik (Germany)

    Executive Standard: JESD22-A106

    Test Item: Power Cycling Test (PC)

    Experimental Conditions: -40 °C (15min) ~ +125 °C (15min), 500 cycles

    Testing Manufacturer: Vötschtechnik (Germany)

    Executive Standard: JESD22-A106

    Test Item: Highly Accelerated Stress Test (HAST)

    Experimental Conditions: Ta = 130 ± 2 °C, 85 % ± 5% RH，230 kPa (Relative Pressure), Vce=42V, 96h

    Testing Manufacturer: HIRAYAMA株式会社 (Japan)

    Executive Standard: JESD22-A110

    Test Item: Unbiased Highly Accelerated Stress Test (UHAST)

    Experimental Conditions: Ta = 130 ± 2 °C, 85 % ± 5 % RH, 230 kPa (Relative Pressure), 96h

    Testing Manufacturer: HIRAYAMA株式会社 (Japan)

    Executive Standard: JESD22-A118

    Test Item: Temperature Cycling Test (TCT)

    Experimental Conditions: 25 °C ~ −40 °C (cooling, 4.5 min) ~ −40 °C (dwell, 15 min) ~ 25 °C (heating, 4.5 min) ~ 25 °C (dwell, 5 min) ~ 125 °C (heating, 7 min) ~ 125 °C (dwell, 15 min) ~ 25 °C (cooling, 7 min) ~ 25 °C (dwell, 5 min) , 500 cycles

    Testing Manufacturer: Vötschtechnik (Germany)

    Executive Standard: JESD22-A104

    Test Item: High Temperature Reverse Bias Test (HTRB)

    Experimental Conditions: Ta=125; VCE=480V; 1000Hrs

    Testing Manufacturer: Hangzhou Zhong'an Electronics Co., Ltd.

    Executive Standard: JESD22-A108

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